Focused ion beam imaging of laser ablation subsurface effects on layered materials
H. Téllez, J.M. Vadillo, R.J. Chater, J.J. Laserna, D.S. McPhail, Applied Surface Science, 2008, 255, 2265 – 2269
- February 26, 2008
H. Téllez, J.M. Vadillo, R.J. Chater, J.J. Laserna, D.S. McPhail, Applied Surface Science, 2008, 255, 2265 – 2269
