Atomic/molecular depth profiling of nanometric-metallized polymer thin films by SIMS
H. Téllez, J. M. Vadillo, J. J. Laserna, Rapid Communications in Mass Spectrometry, 2010, 24, 463 – 468
H. Téllez, J. M. Vadillo, J. J. Laserna, Rapid Communications in Mass Spectrometry, 2010, 24, 463 – 468