Laser-ionization mass spectrometry. Principles and applications in materials characterization
Laser ionization mass spetrometry (LIMS) exhibits a lateral resolution comprissed between 150 and 500 micrometers and roughing rates which range between 10 and 100 nm/pulse. With these features, LIMS is particularly interesting for solving problems in the field of thick coating layers such as antioxidants on ferrous base. Materials analyzed include Si based solar cells; high performance capacitors installed on high speed lines, passivation layers and alteration in stainless steel, sheet materials, coatings, thin films; nanomaterials.
